Electron Microscopes

Hitachi H-7650 Transmission Electron Microscope

This transmission electron microscope (TEM) can achieve 70X to 200,000X magnification with 40 to 120 kv accelerating voltage. The TEM also can achieve maximum of 500,000X magnification in the high-resolution mode. The 16 megapixel EMCCD camera mounted at the low-mount position (Advanced Microscopy Techniques) generates high quality images of ultrastructure.

Helios 5 CX FIB-SEM

The Helios 5 CX is a powerful imaging system that combines a focused ion beam (FIB)
and a scanning electron microscope (SEM) to provide high-resolution imaging and
precise nanoscale fabrication capabilities. This system is equipped with advanced
features, such as a gas injection system, detectors for backscattered electrons and
secondary electrons. One of the key advantages of the Helios 5 CX is its ability to produce three-dimensional images of samples with intricate structures at the nanometer scale.